Core Research Resource Lab
Hitachi FlexSEM 1000 II

Hitachi FlexSEM 1000 II

The Hitachi FlexSEM 1000 II is a variable pressure scanning electron microscope. The FlexSEM-II is equipped with a secondary electron detector, a 5-segment back-scattered electron detector, and a ultra-variable-pressure detector for variable pressure SE imaging, which gives it the ability to image non-conductive surfaces, such as plastic and silicon substrates with submicron resolution.

Also included is an Oxford EDS system that makes it possible to perform simultaneous elemental analysis of surfaces.

For instrument training or assistance with sample preparation, please contact Microscopy and Analytical Imaging Lab personnel.

Reserve the Hitachi SEM

CMADP Upcoming Events

HBC Inaugural Brenda Shivers Lecture
by Prof. Eugenia Trushina
Dept. of Neurology and Pharmacology
Mayo Clinic, Rochester, MN

"Exploiting mitochondrial signaling for therapy of neurodegenerative diseases"
Friday, May 14, 2021 at 10:00am

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